Improves DUT burn-in energy efficiency (ex: LD 100mA@2V, from 40% to approx. 70%)

Independent channel switching function for LD current source.
LD current/voltage monitoring
Adjustable and fine-tunable MPD reverse bias (supports different pin positions) and MPD Im monitoring
Monitoring MPD Im for independent of the panel test board anode processing aging and short circuits, normal operations are still functionable.

One-slot DUT LIV scanning, data recording and calculation of Ith <6min (0~120mA, 0.5mA step)

Compatible with the client's custom software to upload testing status to host computer, can be monitored in the main control room or remote state.
Compatible with the client's custom software to upload testing status to Data Base

Components with adjustable upper voltage limit to protect DUT from potential over-voltage damage

Automatic detection of open/short circuit and current source shut-down for DUT protection

Prevents surges caused by poor contact between aging connectors

During system trips, system remains active for a few seconds before switching off current source

If the control signal module fails or if the computer crashes or if the communication cable becomes loose or if the oven overheats, current source will be switched off for protection.

In case of power failure / crash / abnormality resulting in burn-in process interruption, after eliminating the situation, automatic data succession can be restored to the last recording point after restarting the machine.