TO LIV Testing System

i. LD current source: 0~50mA/0~100mA/0~200mA/0~500mA; four sets of configurations

ii. PD voltage source: -5V~+5V programmable for PD bias voltage control, monitoring PD light current 0~2000mA

iii. Software selection of the TO pin; for example, the C pin of the LD, containing a PD. The tester is programmed to control the XY panning table and LIV tester, sequentially testing the 64 items to be tested.

iv. Provided with Testwell Smart Protection System to ensure that the DUT is protected from surge induced damage.

v. LIV Sweep function, rapid scanning LIV curve and calculate the corresponding parameters

Power: AC 220V 5A

Transmission: USB 2.0

Dimensions: 70cm X 70cm X 75cm (L X W X H)